Richard L. Higgins, Ph.D.

             I.      R. Higgins, “Better Testing Improves Component Reliability”, Photonics Spectra Magazine, August 2001, p. 135 – 137

          II.      R. Higgins, “High Temperature Conductance of the Single Electron Transistor” Applied Physics Laboratory 1995

       III.      R. Higgins, “Quantum Measurements Performed with a Single-Electron Transistor” Applied Physics Laboratory, 1995

       IV.      R. Higgins, “A Physics-of-Failure Approach to Accelerated Life Testing of Electronic Equipment”, Reliability and Engineering Branch Publication, NASA, 1994 

          V.      R. Higgins, “Electronic Properties of Coherently Strained Semiconductors”, Journal of Semiconductor Physics, 1999, European Physical Society, p. 84 - 92.

       VI.      R. Higgins, W. Vigrass, “Calculation of Semiconductor Failure Rates”, Harris Semiconductor , 1998

    VII.      R. Higgins, J. Sites, “Device Physics Of Thin-Film Polycrystalline Cells And Modules” Colorado State University

 VIII.      R. Higgins, J. Sites,  “Current-Voltage Characteristics of Polymer Light-Emitting Diodes” Colorado State University