Richard L. Higgins, Ph.D.

There is a single light of science, and to brighten it anywhere is to brighten it everywhere. - Isaac Asimov

Technical Skills

·   Mathematical modeling analyst, reliability allocations, fault modeling, algorithm development, test generation algorithms, fault simulation, functional testing, design for testability and built-in self-test (BIT)

·   Developed and administered reliability environmental testing on fiber-optic components per GR-20, GR-63, GR-357, GR-468, GR-1221, GR-1209, GR-2912, SR-332, SR-TSY-001171, MIL-STD-883, NEBS Level 111 testing methods and reliability MTBF/MTTR/FIT predictions and allocations in accordance with MIL-HDBK-217, IEC TR 62380 (formerly RDF 2000), GJB/Z 299B, NSWC06/LE10, HRD5 and CNET 93

·   Familiar with and have used most safety standards including European Regulations for semiconductor industries SEMI S2-93A, "Safety Guidelines for Semiconductor Manufacturing Equipment," and SEMI S8-95 "Safety Guidelines for Ergonomics/Human Factors Engineering of Semiconductor Manufacturing Equipment"

·   Advanced knowledge of electro-optical, optoelectronic, high frequency fiber-optic and photonic devices, analog/digital electronic components, MEMS, GaAs, III-V, Device Physics, RF and microwave active/passive SMT devices and experience with optical power meters/detectors/spectrum analyzers, optical performance testing of WDMs, DWDMs, switches, waveguides, polarization components and tap couplers

·   Extensive knowledge of active/passive electronic components, RF, MEMS, microwave, optoelectronic, photonic and fiber-optic components, electro-mechanical and mechanical components including a working understanding of the technologies, processes, and inter-relationships of semiconductors, passive components, optical components, ASICs, PWB’s, Materials/Processes, and other critical-to-success components.

·   Developed and administered ESS/HALT/HASS testing programs on electronic systems; for salt spray, humidity, vibration, shock, etc. on RF to high frequency devices in accordance with MIL-STD-202, MIL-STD-750, MIL-STD-810 and MIL-STD-883 reliability level “S”. Thermal Profiling, and Probability Ratio Sequential Testing (PRST) per MIL-HDBK 781.

·   Evaluate and test EMC/EMI/RFI/ESD shielding & grounding techniques used on airborne, ground mobile, aerospace and electronic test equipment/subsystems and implemented HERF (High Energy Radiated Field) testing in accordance with MIL-STD-461, -462, -469, -1686 and MIL-HDBK-237

·   Familiarization and have used most software packages such as Word Perfect, MS Office, Word, Excel, Power Point, Access, Project, AutoCAD, Maple, Relex, ReliaSoft’s ALTA 6, RGA 6, Lamda Predict and Weibull ++, QuART Pro, LabVIEW, MathType MathWorks, MathLab, Mathematica, and MathCAD Professional, Table Curve, Minitab, and StatGraphies Plus, Remedy

·   Coordinated design and start-up of a Failure Analysis Laboratory and Environmental Testing Laboratory, including lab equipment layout, space utilization, ordering, installation, and purchase of scientific/engineering test equipment, within allotted budget. Established and implemented operations and lab test procedures

·   Familiar with and have used reliability techniques such as Weibull analysis, Monte Carlo analysis, Crow Discrete Reliability Growth Model, Duane Model, Bayes Theorem, Markov Model, Worst Case Circuit analysis, Fault-Tree analysis, component and system level Root Cause Failure Analysis, identifying failure mechanism and implementing corrective action, FMEA, FMECA, derating/stress techniques using AS-4613, MIL-HDBK-1547, MIL-STD-975 and TE000-AB-GTP-010 to develop and analyze reliable products

·   Extensive knowledge in engineering and scientific fields of Optoelectronics, Fiber-Optics, Statistics, Mathematics, System Analyst, Component Engineering, Software Reliability, Reliability and Maintainability Engineering, Quality Assurance, Test Engineering, Environmental Testing, Component Failure Analysis, Mathematical/Statistical Analysis, Algorithm Development, and Applied/Theoretical Solid State Physics

·   Designed and developed reliability tests and performed reliability predictions on DC/DC power modules and UPS (Uninterruptible Power Systems) from 10 – 30 KVA systems including the design of test fixtures

·   Knowledge and have used most ANSI, CSA, EMC, EIA, UL, CE, TUV, MIL, NASA, DoD, JEDEC, Telcordia (Bellcore), ISO9000/9001, TL9000, NAV and international regulatory/compliance standards

·   Extensive knowledge of active/passive and SMT electronic components including strip-line circuit designs, manufacturing processes, chemistry and semiconductor device physics

·   Extensive knowledge of active/passive and SMT electronic components including strip-line circuit designs, manufacturing processes, chemistry and semiconductor device physics